Abstract
Clutter, defined as the confounding effects of interfering chemical species, physical effects, noise
and instrument non-idealities, is present in all measurements. Sources of clutter include variation in
chemical interferents, physical effects such as scattering due to particles, changes in temperature or pressure,
instrument drift, detector non-linearity, as well as non-systematic random noise. The effect of clutter on
models for sample classification or regression can be mitigated through use of a clutter model. These models
can be derived in a number of ways such as combined class-centered data, background characterization or y-
block gradient. Once obtained, they can be used to construct filters to be used in preprocessing, such as
Generalized Least Squares Weighting, (GLSW), and External Parameter Orthogonalization (EPO). Clutter models
can also be used directly with alternative model forms based on Classical Least Squares (CLS) such as Extended
Least Squares (ELS). This talk discusses methods for obtaining clutter models and demonstrates their use in a
number of applications.
Over the past dozen years, a number of powerful spectral analysis methods have been published which make
use of orthogonalization (i.e. projection followed by weighted subtraction) of interferences or "clutter." These
filtering methods provide a means to mitigate the effect of interferences arising from background chemical or
physical species, instrumental artifacts, systematic sampling errors and instrument or system drift. They have
been used very effectively with complex biological systems, remote sensing applications, chemical process
monitoring and calibration transfer problems.
This class of methods includes Orthogonal Partial Least Squares (O-PLS), External Parameter Orthogonalization
(EPO), Dynamic Orthogonal Projection (DOP), Orthogonal Signal Correction (OSC), Constrained Principal
Spectral Analysis (CPSA), Generalized Least Squares Weighting (GLSW), and Science Based Calibration (SBC)
among others. All are based on the orthogonalization premise and each touts a unique ability to improve
model performance, robustness, and/or interpretability.
Some relationships between these methods are noted, along with ties to older work. Examples are given of the
use of the methods in calibration and classification problems in pharmaceutical, petrochemical and remote